{"id":358,"date":"2018-01-23T12:27:53","date_gmt":"2018-01-23T12:27:53","guid":{"rendered":"http:\/\/transistorgrab.de\/?p=358"},"modified":"2018-01-23T12:43:30","modified_gmt":"2018-01-23T12:43:30","slug":"vorlage-testbericht","status":"publish","type":"post","link":"https:\/\/transistorgrab.de\/zh\/2018\/01\/23\/vorlage-testbericht\/","title":{"rendered":"Vorlage Testbericht"},"content":{"rendered":"<p>In meinem Beruf muss ich viele Tests in der Hardwareentwicklung durchf\u00fchren.<\/p>\n<p>\u00dcber die Jahre haben wir meiner Meinung nach eine ziemlich gute Vorlage f\u00fcr unsere Testberichte erarbeitet.<\/p>\n<p>Diese habe ich auf ein einfaches Textformat vereinfacht, um nur die Struktur und die ben\u00f6tigten Informationen zur Verf\u00fcgung zu stellen. Das Design muss jeder f\u00fcr sich festlegen oder den Firmenanforderungen anpassen, so wie Kopf- und Fu\u00dfzeile, Firmenlogo, Schriftart usw.<\/p>\n<p>Wer also den Bedarf eines strukturierten Dokuments f\u00fcr seine Hardware-Tests hat, bittesch\u00f6n:<\/p>\n<p><!--more--><br \/>\n<a href=\"http:\/\/transistorgrab.de\/wp-content\/uploads\/2018\/01\/Test-report-skeletton.txt\">Test-report-skeleton<\/a><\/p>\n<pre>\n= Test Report [Test Scope]\n\n== General\n\nProject Name:           ____\nDevice under Test:      ____ [name of PCB\/item]\nTest Subject:           ____ [tested component\/functional block]\nMaturity Level:         ____ [e.g. prototype, series sample]\n\nTest Operator:          ____ [who performed this test]\nTest Date:              ____ [when was this test done]\n\nResponsible Developer:  ____ [who designed this, who can be asked]\nReviewer\/Approver:      ____ [who decides that this report is good]\n\nTest Catalog:           ____ [where is this test defined\/tracked]\nSchematics:             ____ [where is the documentation for this PCB]\nDocument ID\/Revision:   ____ [what is the number of this document for tracking]\n\n== Test Summary\n\n|| Component         || Test Case       || Test ID           || Rating ||\n| System component A | Test Case Name 1 | Test Case Number 1 | rating  |\n| System component A | Test Case Name 2 | Test Case Number 2 | rating  |\n| System component B | Test Case Name 3 | Test Case Number 3 | rating  |\n| System component B | Test Case Name n | Test Case Number n | rating  |\n\nValues for rating: PASSED, FAILED\n  additional possibilities: SKIPPED, BLOCKED, RUNNING\n\n== General Test Setup\n\n=== Device Under Test\n\nDevice Name:    ____\nVersion:        ____\nSer.No.:        ____\n\n=== Test Equipment\n\n[What actual equipment was used performing this test.]\n\n|| Ref. || Function     || Manufacturer and Type   || Inventory No. ||\n|  TE1  |  Power Supply |  Some Power Man, PSU0815 |  4711          |\n|  TE2  |  Multimeter   |  Some Meter Man, MULT007 |  4712          |\n|  TE3  |  Oscilloscope |  Some Scope Man, OSC3004 |  4004          |\n\n=== Board Bring-Up\n\n* First action to prepare the test\n* second action to prepare the test\n* n-th action\n\n== Test Protocol\n\n=== Bug List\n|| Bug No. || Bug Description            || Bugfix                    || Severity   || Fixed in Version  ||\n|  1       |  Bug 1 description          | short bugfix description,  |  bug rating |  fixed version No. |\n|          |  link to bug tracking tool  |                            |             |                    |\n\nSuggestion for bug severity rating: Minor, Major, Critical\n\n=== Test Case 1\n\n==== Testing Purpose\nWhy is this test done, what does it show\/prove?\n\n==== Test Setup and Instructions\n\n* Test Conditions\n  - What must be done prior to successfully executing this test.\n\n* Test Instructions\n  - Step 1 [e.g. set up the output voltage of the power supply]\n  - Step 2 [e.g. connect oscilloscope to the required signals]\n  - Step 3 [e.g. connect additional load to circuit]\n  - Step 4 [e.g. activate power supply]\n  - \u2026\n\n==== Test Results\n\nTable: Test Results Test Case 1\n\n|| Description               || Test Point || Expectation     || Resu   lt     || Rating ||  Notes        ||\n|  Description Test Detail 1 |  Signal 1   |  Expected result |  actual result |  rating |  optional note |\n|  Description Test Detail n |  Signal n   |  Expected result |  actual result |  rating |  optional note |\n\n(Rating values are identical to test summary ratings.)\n\n===== Additional Test Documentation [e.g. Oscillogram Screenshots]\n\nAdditional Material\n\n==== Conclusion\n\nIs this test case passed?\nAre there observations that need to be explained?\nIf needed provide explanation why test is rated passed.\nWhat must be done to pass this test (if failed)?\n\n<\/pre>\n","protected":false},"excerpt":{"rendered":"<p>In meinem Beruf muss ich viele Tests in der Hardwareentwicklung durchf\u00fchren. \u00dcber die Jahre haben wir meiner Meinung nach eine ziemlich gute Vorlage f\u00fcr unsere Testberichte erarbeitet. Diese habe ich auf ein einfaches Textformat vereinfacht, um nur die Struktur und die ben\u00f6tigten Informationen zur Verf\u00fcgung zu stellen. Das Design muss jeder f\u00fcr sich festlegen oder &hellip; <a href=\"https:\/\/transistorgrab.de\/zh\/2018\/01\/23\/vorlage-testbericht\/\" class=\"more-link\">\u7ee7\u7eed\u9605\u8bfb<span class=\"screen-reader-text\">Vorlage Testbericht<\/span> <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_jetpack_newsletter_access":"","_jetpack_dont_email_post_to_subs":false,"_jetpack_newsletter_tier_id":0,"_jetpack_memberships_contains_paywalled_content":false,"_jetpack_feature_clip_id":0,"_jetpack_memberships_contains_paid_content":false,"footnotes":"","jetpack_publicize_message":"","jetpack_publicize_feature_enabled":true,"jetpack_social_post_already_shared":true,"jetpack_social_options":{"image_generator_settings":{"template":"highway","default_image_id":0,"font":"","enabled":false},"version":2},"jetpack_post_was_ever_published":false},"categories":[1],"tags":[88,90,89,87],"class_list":["post-358","post","type-post","status-publish","format-standard","hentry","category-allgemeines","tag-development","tag-hardware","tag-report","tag-testing"],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"","jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/p8KIDw-5M","jetpack-related-posts":[],"_links":{"self":[{"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/posts\/358","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/comments?post=358"}],"version-history":[{"count":0,"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/posts\/358\/revisions"}],"wp:attachment":[{"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/media?parent=358"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/categories?post=358"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/transistorgrab.de\/zh\/wp-json\/wp\/v2\/tags?post=358"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}